مؤتمر
Yield and reliability of 3DIC technology for advanced 28nm node and beyond.
| العنوان: | Yield and reliability of 3DIC technology for advanced 28nm node and beyond. |
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| المؤلفون: | Yang, K.F., Wu, T.J., Chiou, W.C., Chen, M.F., Lin, Y.C., Tsai, F.W., Hsieh, C.C., Chang, C.H., Wu, W.J., Chen, Y.H., Chen, T.Y., Wang, H.R., Lin, I.C., Jan, S.B., Wang, R.D., Lu, Y.J., Shih, Y.C., Teng, H.A., Tsai, C.S., Chang, M.N. |
| المصدر: | 2011 Symposium on VLSI Technology (VLSIT); 2011, p140-141, 2p |
| قاعدة البيانات: | Complementary Index |
| ردمك: | 9781424499496 |
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