مؤتمر
Investigation of tunneling field effect transistor reliability
| العنوان: | Investigation of tunneling field effect transistor reliability |
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| المؤلفون: | Jiao, G. F., Huang, X. Y., Chen, Z. X., Cao, W., Huang, D. M., Yu, H. Y., Singh, N., Lo, G. Q., Kwong, D.-L., Li, Ming-Fu |
| المصدر: | 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology |
| بيانات النشر: | IEEE |
| سنة النشر: | 2010 |
| نوع الوثيقة: | conference object |
| اللغة: | unknown |
| DOI: | 10.1109/icsict.2010.5667426 |
| الإتاحة: | https://doi.org/10.1109/icsict.2010.5667426Test http://xplorestaging.ieee.org/ielx5/5658734/5667273/05667426.pdf?arnumber=5667426Test |
| رقم الانضمام: | edsbas.10E01F40 |
| قاعدة البيانات: | BASE |
| DOI: | 10.1109/icsict.2010.5667426 |
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