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المؤلفون: C. K. Maiti, Tanmoy Das, Mrinal K. Hota, Sandipan Mallik, Milan Kumar Bera, B. Majhi, Chandreswar Mahata
المصدر: 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.
مصطلحات موضوعية: Materials science, Condensed matter physics, Silicon, Analytical chemistry, chemistry.chemical_element, Charge (physics), Dielectric, Trapping, law.invention, Capacitor, Paramagnetism, chemistry, law, Aluminium, Electron paramagnetic resonance
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::4ceed2bab4d9c905be8a9b03a157d904Test
https://doi.org/10.1109/ipfa.2009.5232718Test -
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المؤلفون: Goutam Kumar Dalapati, Pradip K. Bose, D. Chi, C. K. Maiti, Chandreswar Mahata, Tanmoy Das, Goutam Sutradhar
المصدر: 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.
مصطلحات موضوعية: Materials science, Passivation, Silicon, business.industry, Annealing (metallurgy), Gate dielectric, chemistry.chemical_element, Dielectric, Trapping, Gallium arsenide, chemistry.chemical_compound, chemistry, Logic gate, Electronic engineering, Optoelectronics, business
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::f083eb4ea54c00e2834fbe046fa624a4Test
https://doi.org/10.1109/ipfa.2009.5232683Test -
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المؤلفون: C. K. Maiti, Sandipan Mallik, B. Majhi, Chandan Kumar Sarkar, Mrinal K. Hota, Tanmoy Das, Chandreswar Mahata, Milan Kumar Bera
المصدر: 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.
مصطلحات موضوعية: Materials science, business.industry, Electrical breakdown, Electrical engineering, Substrate (electronics), Dielectric, Capacitance, law.invention, Capacitor, law, Optoelectronics, Breakdown voltage, Constant current, business, Voltage
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::480f3ac3ed162694171b351e3f6a4950Test
https://doi.org/10.1109/ipfa.2009.5232720Test