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1مؤتمر
المؤلفون: Nenyei, Z., Niess, J., Lerch, W., Dietl, W., Timans, P. J., Pichler, P.
المصدر: 2006 14th IEEE International Conference on Advanced Thermal Processing of Semiconductors
الإتاحة: https://doi.org/10.1109/rtp.2006.367998Test
http://xplorestaging.ieee.org/ielx5/4200427/4223089/04223125.pdf?arnumber=4223125Test -
2مؤتمر
المؤلفون: Gelpey, J., McCoy, S., Camm, D., Lerch, W., Paul, S., Pichler, P., Borland, J.O., Timans, P.
المصدر: 2006 14th IEEE International Conference on Advanced Thermal Processing of Semiconductors; 2006, p103-110, 8p
