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المؤلفون: Sheng Guangdi, Cheng Yaohai, Guo Weiling, Zhou Tianyi, Chan Changhua, Li Zhiguo
المصدر: 1998 5th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.98EX105).
مصطلحات موضوعية: Temperature gradient, Mean time between failures, Materials science, Reliability (semiconductor), Analytical chemistry, Titanium alloy, Negative temperature, Composite material, Electromigration, Current density, Line (formation)
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::2397dda97bbe4acaec683c0f1253a607Test
https://doi.org/10.1109/icsict.1998.785860Test -
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المؤلفون: Zhang Wan-rong, Luo Jinsheng, Chen Jianxin, Shen Guang-di, Chang Yao-Hai, Li Zhiguo
المصدر: 1998 5th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.98EX105).
مصطلحات موضوعية: Materials science, Effective density, Valence (chemistry), Condensed matter physics, Semiconductor materials, Ionization, Doping, Analytical chemistry, Electronic density of states
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::eeaf5da17a3203b3ea977b436a77252cTest
https://doi.org/10.1109/icsict.1998.786136Test