X-ray phase-contrast imaging

التفاصيل البيبلوغرافية
العنوان: X-ray phase-contrast imaging
Patent Number: 9,801,600
تاريخ النشر: October 31, 2017
Appl. No: 14/943157
Application Filed: November 17, 2015
مستخلص: Systems and methods for X-ray phase-contrast imaging (PCI) are provided. A quasi-periodic phase grating can be positioned between an object being imaged and a detector. An analyzer grating can be disposed between the phase grating and the detector. Second-order approximation models for X-ray phase retrieval using paraxial Fresnel-Kirchhoff diffraction theory are also provided. An iterative method can be used to reconstruct a phase-contrast image or a dark-field image.
Inventors: Wang, Ge (Loudonville, NY, US); Xi, Yan (Troy, NY, US); Cong, Wenxiang (Albany, NY, US)
Assignees: Rensselaer Polytechnic Institute (Troy, NY, US)
Claim: 1. An X-ray phase-contrast imaging (PCI) system, comprising: an X-ray source; a detector; a first grating disposed between the X-ray source and the detector; and a second grating disposed between the first grating and the detector, wherein the first grating is a quasi-periodical phase grating such that a period of the first grating varies across the first grating and changes equally in both lateral directions.
Claim: 2. The system according to claim 1 , wherein the second grating is an analyzer grating.
Claim: 3. The system according to claim 1 , wherein the detector is flat.
Claim: 4. The system according to claim 3 , wherein the detector is a flat detector array.
Claim: 5. The system according to claim 1 , wherein the second grating is flat.
Claim: 6. The system according to claim 1 , wherein the first grating is curved.
Claim: 7. The system according to claim 6 , wherein the first grating is a cylindrical grating or a spherical grating.
Claim: 8. The system according to claim 1 , wherein the detector is flat, wherein the second grating is flat, and wherein the first grating is a cylindrical grating or a spherical grating.
Claim: 9. The system according to claim 1 , further comprising a source grating disposed between the X-ray source and the first grating.
Claim: 10. The system according to claim 9 , wherein the source grating is a cylindrical grating or a spherical grating.
Claim: 11. The system according to claim 1 , wherein the period of the first grating varies the same way in both lateral directions as an angle is varied positively or negatively by the same amount from a point on the first grating where X-rays from the X-ray source are centered during imaging.
Claim: 12. A method of performing X-ray phase-contrast imaging, comprising: providing the imaging system according to claim 1 ; positioning an object to be imaged between the X-ray source and the first grating; and imaging the object using the system.
Claim: 13. The method according to claim 12 , wherein the detector is flat, wherein the second grating is flat, and wherein the first grating is a cylindrical grating or a spherical grating.
Claim: 14. The method according to claim 13 , wherein the second grating is an analyzer grating.
Claim: 15. The method according to claim 13 , wherein the imaging system further comprises a source grating disposed between the X-ray source and the first grating, wherein the source grating is a cylindrical grating or a spherical grating, and wherein the object is positioned between the source grating and the first grating for imaging of the object.
Claim: 16. The system according to claim 1 , wherein the first grating is disposed closer to the detector than it is to the X-ray source such that the system is configured so the first grating is disposed between the detector and an object to be imaged.
Patent References Cited: 2013/0028378 January 2013 Stutman
2015/0092914 April 2015 Anton
2015/0279496 October 2015 Bauer
2016/0022235 January 2016 Ning





















































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Primary Examiner: Wong, Don
Attorney, Agent or Firm: Saliwanchik, Lloyd & Eisenschenk
رقم الانضمام: edspgr.09801600
قاعدة البيانات: USPTO Patent Grants