Structure and dielectric properties of La{sub x}Hf{sub (1−x)}O{sub y} thin films: The dependence of components
التفاصيل البيبلوغرافية
العنوان:
Structure and dielectric properties of La{sub x}Hf{sub (1−x)}O{sub y} thin films: The dependence of components
المساهمون:
He, Bo [National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei, Anhui 230029 (China)]
المصدر:
Materials Research Bulletin; 48; 7; Other Information: Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA)
