Afterpulse-like noise limits dynamic range in time-gated applications of thin-junction silicon single-photon avalanche diode
العنوان: | Afterpulse-like noise limits dynamic range in time-gated applications of thin-junction silicon single-photon avalanche diode |
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المؤلفون: | Antonio Pifferi, Davide Contini, A. Dalla Mora, Alberto Tosi, F. Zappa, Rinaldo Cubeddu |
المصدر: | Applied Physics Letters; Vol 100 Applied physics letters 100 (2012). doi:10.1063/1.4729389 info:cnr-pdr/source/autori:Dalla Mora, Alberto; Contini, Davide; Pifferi, Antonio; Cubeddu, Rinaldo; Tosi, Alberto; Zappa, Franco/titolo:Afterpulse-like noise limits dynamic range in time-gated applications of thin-junction silicon single-photon avalanche diode/doi:10.1063%2F1.4729389/rivista:Applied physics letters/anno:2012/pagina_da:/pagina_a:/intervallo_pagine:/volume:100 |
بيانات النشر: | AMER INST PHYSICS, 2012. |
سنة النشر: | 2012 |
مصطلحات موضوعية: | Avalanche diode, Materials science, Physics and Astronomy (miscellaneous), Noise-figure meter, sezele, Physics::Instrumentation and Detectors, business.industry, Shot noise, 02 engineering and technology, 01 natural sciences, Avalanche breakdown, 010309 optics, 020210 optoelectronics & photonics, Optics, Single-photon avalanche diode, Noise generator, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Optoelectronics, Transient-voltage-suppression diode, Zener diode, business |
الوصف: | We describe a source of noise in thin-junction silicon single-photon avalanche diode arising after strong illumination either during the ON (voltage above breakdown) or the OFF (voltage below breakdown) time. It increases the background noise with respect to primary dark count rate similarly to the afterpulsing process, but it is not related to a previous detector ignition. The amount of noise is linearly dependent on the power of light impinging on the detector and time constants are independent of the electric field. This phenomenon is the main limiting factor for the dynamic-range during time-gated measurements in condition of strong illumination. © 2012 American Institute of Physics. |
اللغة: | English |
تدمد: | 0003-6951 |
DOI: | 10.1063/1.4729389 |
الوصول الحر: | https://explore.openaire.eu/search/publication?articleId=doi_dedup___::19a666d656da78412d0da32147597a07Test |
حقوق: | OPEN |
رقم الانضمام: | edsair.doi.dedup.....19a666d656da78412d0da32147597a07 |
قاعدة البيانات: | OpenAIRE |
تدمد: | 00036951 |
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DOI: | 10.1063/1.4729389 |