مؤتمر
Properties of Vacancies in Silicon Determined from Laser--Annealing Experiments.
| العنوان: | Properties of Vacancies in Silicon Determined from Laser--Annealing Experiments. |
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| المؤلفون: | Pichler, P. |
| المصدر: | 32nd European Solid-State Device Research Conference; 2002, p335-338, 4p |
| قاعدة البيانات: | Complementary Index |
| ردمك: | 9788890084782 |
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| DOI: | 10.1109/ESSDERC.2002.194937 |