يعرض 1 - 10 نتائج من 41 نتيجة بحث عن '"Shu, Kai"', وقت الاستعلام: 0.83s تنقيح النتائج
  1. 1
    دورية أكاديمية
    Self-Assured Deep Learning With Minimum Pre-Labeled Data for Wafer Pattern Classification.

    المؤلفون: Fan, Shu-Kai S.1 (AUTHOR) morrisfan@ntut.edu.tw, Tsai, Du-Ming2 (AUTHOR), Shih, Ya-Fang1 (AUTHOR)

    المصدر: IEEE Transactions on Semiconductor Manufacturing. Aug2023, Vol. 36 Issue 3, p404-415. 12p.

    مصطلحات موضوعية: DEEP learning, SUPERVISED learning, PATTERN recognition systems, CONVOLUTIONAL neural networks, MACHINE learning, CLASSIFICATION, JUDGMENT (Psychology)


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  2. 2
    دورية أكاديمية
    Effective Variational-Autoencoder-Based Generative Models for Highly Imbalanced Fault Detection Data in Semiconductor Manufacturing.

    المؤلفون: Fan, Shu-Kai S.1 (AUTHOR) morrisfan@ntut.edu.tw, Tsai, Du-Ming2 (AUTHOR), Yeh, Pei-Chi1 (AUTHOR)

    المصدر: IEEE Transactions on Semiconductor Manufacturing. May2023, Vol. 36 Issue 2, p205-214. 10p.

    مصطلحات موضوعية: *SEMICONDUCTOR manufacturing, CHEMICAL vapor deposition, DATA augmentation, LATENT variables


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  3. 3
    دورية أكاديمية
    Sustainable multi-biofuel production with stochastic lead time and optimum energy utilization under flexible manufacturing.

    المؤلفون: Sarkar, Biswajit1,2 (AUTHOR) bsbiswajitsarkar@gmail.com, Fan, Shu-Kai S.3 (AUTHOR), Pareek, Sarla4 (AUTHOR), Mridha, Bablu1,5 (AUTHOR) bmbablumridha@gmail.com

    المصدر: Computers & Industrial Engineering. Jul2024, Vol. 193, pN.PAG-N.PAG. 1p.


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  4. 4
    دورية أكاديمية
    A new ViT-Based augmentation framework for wafer map defect classification to enhance the resilience of semiconductor supply chains.

    المؤلفون: Fan, Shu-Kai S.1,2 (AUTHOR) morrisfan@ntut.edu.tw, Chiu, Shang-Hao1 (AUTHOR)

    المصدر: International Journal of Production Economics. Jul2024, Vol. 273, pN.PAG-N.PAG. 1p.

    مصطلحات موضوعية: *TRANSFORMER models, *SUPPLY chains, *SEMICONDUCTOR manufacturing, CONVOLUTIONAL neural networks, DATA augmentation


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  5. 5
    دورية أكاديمية
    Product-to-Product Virtual Metrology of Color Filter Processes in Panel Industry.

    المؤلفون: Fan, Shu-Kai S.1 (AUTHOR) morrisfan@ntut.edu.tw, Chang, Xiao-Wen1 (AUTHOR), Lin, Yu-Yu1 (AUTHOR)

    المصدر: IEEE Transactions on Automation Science & Engineering. Oct2022, Vol. 19 Issue 4, p3496-3507. 12p.

    مصطلحات موضوعية: COLOR filter arrays, LIQUID crystal films, THIN film transistors, LIQUID crystal displays, METROLOGY, LIGHT filters


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  6. 6
    دورية أكاديمية
    Fault Diagnosis of Wafer Acceptance Test and Chip Probing Between Front-End-of-Line and Back-End-of-Line Processes.

    المؤلفون: Fan, Shu-Kai S.1 (AUTHOR) morrisfan@ntut.edu.tw, Cheng, Chun-Wei1 (AUTHOR), Tsai, Du-Ming2 (AUTHOR)

    المصدر: IEEE Transactions on Automation Science & Engineering. Oct2022, Vol. 19 Issue 4, p3068-3082. 15p.

    مصطلحات موضوعية: *SEMICONDUCTOR manufacturing, *CLEAN rooms, *MANUFACTURING processes, FAULT diagnosis, PRINCIPAL components analysis, DATA augmentation


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  7. 7
    دورية أكاديمية
    Key Feature Identification for Monitoring Wafer-to-Wafer Variation in Semiconductor Manufacturing.

    المؤلفون: Fan, Shu-Kai S.1 (AUTHOR) morrisfan@ntut.edu.tw, Hsu, Chia-Yu1 (AUTHOR), Tsai, Du-Ming2 (AUTHOR), Chou, Mabel C.3 (AUTHOR) bizchoum@nus.edu.sg, Jen, Chih-Hung4 (AUTHOR), Tsou, Jen-Hsuan1 (AUTHOR)

    المصدر: IEEE Transactions on Automation Science & Engineering. Jul2022, Vol. 19 Issue 3, p1530-1541. 12p.

    مصطلحات موضوعية: *SEMICONDUCTOR manufacturing, *MANUFACTURING processes, *ELECTRONIC data processing, SELF-organizing maps, FEATURE selection, FALSE alarms


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  8. 8
    دورية أكاديمية
    Data Visualization of Anomaly Detection in Semiconductor Processing Tools.

    المؤلفون: Fan, Shu-Kai S.1 (AUTHOR) morrisfan@ntut.edu.tw, Tsai, Du-Ming2 (AUTHOR), Jen, Chih-Hung3 (AUTHOR), Hsu, Chia-Yu1 (AUTHOR), He, Fei4 (AUTHOR) hefei@ustb.edu.cn, Juan, Li-Ting1 (AUTHOR)

    المصدر: IEEE Transactions on Semiconductor Manufacturing. May2022, Vol. 35 Issue 2, p186-197. 12p.

    مصطلحات موضوعية: *SEMICONDUCTOR manufacturing, *GAUSSIAN distribution, ANOMALY detection (Computer security), DATA visualization, SEMICONDUCTORS, ELECTRONIC equipment


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  9. 9
    دورية أكاديمية
    Data-driven optimization of accessory combinations for final testing processes in semiconductor manufacturing.

    المؤلفون: Fan, Shu-Kai S.1 (AUTHOR) morrisfan@ntut.edu.tw, Lin, Wei-Kai1 (AUTHOR), Jen, Chih-Hung2 (AUTHOR)

    المصدر: Journal of Manufacturing Systems. Apr2022, Vol. 63, p275-287. 13p.

    مصطلحات موضوعية: *MANUFACTURING processes, *SEMICONDUCTOR manufacturing, *HEURISTIC, MACHINE learning, GENETIC algorithms, PREDICTION models


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  10. 10
    دورية
    Cross-Domain Graph Anomaly Detection.

    المؤلفون: Ding, Kaize1 (AUTHOR) kaize.ding@asu.edu, Shu, Kai2 (AUTHOR) kshu@iit.edu, Shan, Xuan3 (AUTHOR) shanxuan@kuaishou.com, Li, Jundong4 (AUTHOR) jundong@virginia.edu, Liu, Huan1 (AUTHOR) huan.liu@asu.edu

    المصدر: IEEE Transactions on Neural Networks & Learning Systems. Jun2022, Vol. 33 Issue 6, p2406-2415. 10p.

    مصطلحات موضوعية: ANOMALY detection (Computer security), INTRUSION detection systems (Computer security), FEATURE extraction, INTERNET security


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