التفاصيل البيبلوغرافية
| العنوان: |
Loss Dependence on Geometry and Applied Power in Superconducting Coplanar Resonators. |
| المؤلفون: |
Khalil, Moe S.1, Wellstood, F. C.2, Osborn, Kevin D.1 |
| المصدر: |
IEEE Transactions on Applied Superconductivity. Jun2011, Vol. 21 Issue 3, p879-882. 4p. |
| مصطلحات موضوعية: |
ELECTRIC lines, PHOTONICS, DIELECTRIC loss, MICROWAVE devices, MICROFABRICATION, ALUMINUM films, ELECTRIC resonators |
| مستخلص: |
The loss in superconducting microwave resonators at low-photon numbers and low temperatures is not well understood but has implications for achievable coherence times in superconducting qubits. We have fabricated single-layer resonators with a high quality factor by patterning a superconducting aluminum film on a sapphire substrate. Four resonator geometries were studied with resonant frequencies ranging from 5 to 7 GHz: a quasi-lumped element resonator, a coplanar strip waveguide resonator, and two hybrid designs that contain both a coplanar strip and a quasi-lumped element. Transmitted power measurements were taken at 30 mK as a function of frequency and probe power. We find that the resonator loss, expressed as the inverse of the internal quality factor, decreases slowly over four decades of photon number in a manner not merely explained by loss from a conventional uniform spatial distribution of two-level systems in an oxide layer on the superconducting surfaces of the resonator. [ABSTRACT FROM AUTHOR] |
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