المؤلفون: Pêcheux, François¹ francois.pecheux@lip6.fr, Lallement, Christophe² christophe.lallement@ensps.u-strasbg.fr, Vachoux, Alain³ alain.vachoux@epfl.ch

المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems. Feb2005, Vol. 24 Issue 2, p204-225. 22p.

مصطلحات موضوعية: *SYSTEMS theory, *ELECTRONIC data processing, VHDL (Computer hardware description language), COMPUTER simulation of integrated circuits, COMPUTER hardware description languages, ELECTRONIC circuits

المؤلفون: Lallement, Christophe, Sallese, Jean-Michel, Bucher, Matthias, Grabinski, Wladek, Fazan, Pierre C.

المصدر: IEEE Transactions on Electron Devices. Feb2003, Vol. 50 Issue 2, p406. 12p. 5 Black and White Photographs, 1 Diagram, 1 Chart, 10 Graphs.

مصطلحات موضوعية: METAL oxide semiconductor field-effect transistors, QUANTUM electronics, MODELS & modelmaking, GATE array circuits, ELECTRIC circuits

المؤلفون: Lallement, Christophe, Bouchakour, Rachid

المصدر: IEEE Transactions on Circuits & Systems Part I: Fundamental Theory & Applications. Feb97, Vol. 44 Issue 2, p103. 9p. 9 Diagrams, 3 Charts, 10 Graphs.

مصطلحات موضوعية: *COMPUTER-aided design, MODELING (Sculpture), METAL oxide semiconductor field-effect transistors

المؤلفون: Gendrault, Yves¹, Madec, Morgan¹, Lallement, Christophe¹, Haiech, Jacques²

المصدر: IEEE Transactions on Biomedical Engineering. Apr2014, Vol. 61 Issue 4, p1231-1240. 10p.

مصطلحات موضوعية: SYNTHETIC biology, BIOMEDICAL materials, BIOLOGICAL systems, MICROELECTRONICS research, BIOENGINEERING

المؤلفون: Chevillon, Nicolas¹, Sallese, Jean-Michel², Lallement, Christophe¹, Pr?galdiny, Fabien¹, Madec, Morgan¹, Sedlmeir, Josef³, Aghassi, Jasmin³

المصدر: IEEE Transactions on Electron Devices. Jan2012, Vol. 59 Issue 1, p60-71. 12p.

مصطلحات موضوعية: *MATHEMATICAL models, METAL oxide semiconductor field-effect transistors, ELECTRIC capacity, GATE array circuits, THICKNESS measurement, SILICON, COMPUTER simulation, ELECTRIC measurements

المؤلفون: Sallese, Jean-Michel¹, Chevillon, Nicolas², Lallement, Christophe², Iniguez, Benjamin³, Pregaldiny, Fabien⁴

المصدر: IEEE Transactions on Electron Devices. Aug2011, Vol. 58 Issue 8, p2628-2637. 10p.

مصطلحات موضوعية: *SIMULATION methods & models, ELECTRIC charge, SEMICONDUCTOR junctions, GATE array circuits, METAL oxide semiconductor field-effect transistors, THICKNESS measurement, NUMERICAL analysis

المؤلفون: Tang, Mingchun¹, Prégaldiny, Fabien^2,3 fabien.pregaldiny@iness.c-strasbourg.fr, Lallement, Christophe^2,3, Sallese, Jean-Michel⁴

المصدر: IEEE Transactions on Electron Devices. Jul2009, Vol. 56 Issue 7, p1543-1547. 5p. 1 Diagram, 2 Graphs.

مصطلحات موضوعية: FIELD-effect transistors, SEMICONDUCTORS, ELECTRIC potential, TRANSISTORS, QUANTUM theory, COMPLEMENTARY metal oxide semiconductors

المؤلفون: Madec, Morgan¹ (AUTHOR) morgan.madec@unistra.fr, Bonament, Alexi¹ (AUTHOR), Rosati, Elise¹ (AUTHOR), Takakura, Yoshitate¹ (AUTHOR), Haiech, Jacques¹ (AUTHOR), Hebrard, Luc¹ (AUTHOR), Lallement, Christophe¹ (AUTHOR)

المصدر: IEEE Transactions on Electron Devices. Jan2019, Vol. 66 Issue 1, p34-43. 10p.

مصطلحات موضوعية: *COMPUTER-aided design, BIOSENSORS, BIOLOGICAL systems, ELECTRIC circuits, DIFFUSION, ECOLOGY

المؤلفون: El Ghouli, Salim¹ (AUTHOR) salim.elghouli@st.com, Sallese, Jean-Michel² (AUTHOR), Juge, Andre¹ (AUTHOR), Scheer, Patrick¹ (AUTHOR), Lallement, Christophe³ (AUTHOR)

المصدر: IEEE Transactions on Electron Devices. Jan2019, Vol. 66 Issue 1, p300-307. 8p.

مصطلحات موضوعية: *PERFORMANCE evaluation, METAL oxide semiconductor field-effect transistors, GATES, LOGIC circuits, INTEGRATING circuits, ELECTRIC lines

المؤلفون: El Ghouli, Salim¹, Rideau, Denis¹, Monsieur, Frederic¹, Scheer, Patrick¹, Gouget, Gilles¹, Juge, Andre¹, Poiroux, Thierry², Sallese, Jean-Michel³, Lallement, Christophe⁴

المصدر: IEEE Transactions on Electron Devices. Jan2018, Vol. 65 Issue 1, p11-18. 8p.

مصطلحات موضوعية: *MANUFACTURING processes, TRANSISTORS, ELECTRIC fields, CARRIER density, HOLE mobility