المؤلفون: Kim, Minseo, Beehr, Terry A.

المصدر: European Journal of Work and Organizational Psychology ; volume 29, issue 1, page 126-139 ; ISSN 1359-432X 1464-0643

الإتاحة: https://doi.org/10.1080/1359432x.2019.1697237Test

المؤلفون: Kim, Minseo, Beehr, Terry A.

المصدر: The International Journal of Human Resource Management ; volume 32, issue 9, page 1865-1898 ; ISSN 0958-5192 1466-4399

الإتاحة: https://doi.org/10.1080/09585192.2019.1657166Test

المؤلفون: Jang, Jaeeun, Lee, Jihee, Lee, Kyoung-Rog, Lee, Jiwon, Kim, Minseo, Lee, Yongsu, Bae, Joonsung, Yoo, Hoi-Jun

المساهمون: Institute for Information and communications Technology Promotion

المصدر: IEEE Journal of Solid-State Circuits ; volume 54, issue 2, page 538-549 ; ISSN 0018-9200 1558-173X

الإتاحة: https://doi.org/10.1109/jssc.2018.2873630Test
http://xplorestaging.ieee.org/ielx7/4/8629373/08502781.pdf?arnumber=8502781Test

المؤلفون: Kim, Minseo, Ha, Unsoo, Lee, Kyuho Jason, Lee, Yongsu, Yoo, Hoi-Jun

العلاقة: IEEE JOURNAL OF SOLID-STATE CIRCUITS, v.52, no.7, pp.1953 - 1965; https://ieeexplore.ieee.org/document/7919157Test/; https://scholarworks.unist.ac.kr/handle/201301/24537Test; 3698; 30711; 2-s2.0-85018914009; 000404301300020

الإتاحة: https://doi.org/10.1109/JSSC.2017.2694833Test
https://scholarworks.unist.ac.kr/handle/201301/24537Test
https://ieeexplore.ieee.org/document/7919157Test/

المؤلفون: Kim, Minseo, Jang, Jaeeun, Kim, Hyunki, Lee, Jihee, Lee, Jaehyuck, Lee, Jiwon, Lee, Kyoung-Rog, Kim, Kwantae, Lee, Yongsu, Lee, Kyuho Jason, Yoo, Hoi-Jun

العلاقة: IEEE JOURNAL OF SOLID-STATE CIRCUITS, v.52, no.11, pp.2829 - 2842; https://ieeexplore.ieee.org/document/8057579Test/; https://scholarworks.unist.ac.kr/handle/201301/24536Test; 3698; 30710; 2-s2.0-85031790706; 000413941800004

الإتاحة: https://doi.org/10.1109/JSSC.2017.2753234Test
https://scholarworks.unist.ac.kr/handle/201301/24536Test
https://ieeexplore.ieee.org/document/8057579Test/

المؤلفون: Cho, Hyunwoo, Kim, Hyunki, Kim, Minseo, Jang, Jaeeun, Lee, Yongsu, Lee, Kyuho Jason, Bae, Joonsung, Yoo, Hoi-Jun

العلاقة: IEEE JOURNAL OF SOLID-STATE CIRCUITS, v.51, no.1, pp.310 - 317; https://ieeexplore.ieee.org/document/7362129Test/; https://scholarworks.unist.ac.kr/handle/201301/24528Test; 3698; 30715; 2-s2.0-84971003292; 000367719400030

الإتاحة: https://doi.org/10.1109/JSSC.2015.2498761Test
https://scholarworks.unist.ac.kr/handle/201301/24528Test
https://ieeexplore.ieee.org/document/7362129Test/

المؤلفون: Kim, Minseo, Beehr, Terry A.

المصدر: Stress and Health ; volume 34, issue 3, page 367-378 ; ISSN 1532-3005 1532-2998

الإتاحة: https://doi.org/10.1002/smi.2796Test

المؤلفون: Kim, Minseo, Beehr, Terry A.

المصدر: Journal of Leadership & Organizational Studies ; volume 25, issue 4, page 385-398 ; ISSN 1548-0518 1939-7089

الإتاحة: https://doi.org/10.1177/1548051818762337Test

المؤلفون: Kim, Minseo, Beehr, Terry A., Prewett, Matthew S.

المصدر: Journal of Leadership & Organizational Studies ; volume 25, issue 3, page 257-276 ; ISSN 1548-0518 1939-7089

الإتاحة: https://doi.org/10.1177/1548051817750538Test

المؤلفون: Hong, Seong Kyung, Bae, Seonghan, Jeon, Hyungkook, Kim, Minseo, Cho, Seong J., Lim, Geunbae

المساهمون: National Research Foundation of Korea

المصدر: Nanoscale ; volume 10, issue 6, page 3037-3045 ; ISSN 2040-3364 2040-3372

الإتاحة: https://doi.org/10.1039/c7nr08199eTest
http://pubs.rsc.org/en/content/articlepdf/2018/NR/C7NR08199ETest