دورية أكاديمية
An L-shaped nanoprobe for scanning electrochemical microscopy-atomic force microscopy
العنوان: | An L-shaped nanoprobe for scanning electrochemical microscopy-atomic force microscopy |
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المؤلفون: | Lee, Eunjoo, Kim, Minseo, Seong, Jungwoo, Shin, Heungjoo, Lim, Geunbae |
بيانات النشر: | WILEY-V C H VERLAG GMBH |
سنة النشر: | 2013 |
المجموعة: | ScholarWorks@UNIST (Ulsan National Institute of Science and Technology) |
مصطلحات موضوعية: | AFM, Electrochemical activities, Electrochemical currents, Force microscopy, Scanning electrochemical microscopy, SECM, Surface scanning, Topographical images |
الوصف: | We present an L-shaped nanoprobe for scanning electrochemical microscopy-atomic force microscopy (SECM-AFM) capable of imaging the surface topography and the electrochemical activity of nanostructures of interest. Owing to the geometry of the protrusive peak in the L-shaped probe, the distance between the probe electrode and the substrate is maintained precisely at ???100 nm during surface scanning. The reduction in electrode-to-substrate distance significantly improves the positive feedback current on top of the electrochemically active nanomaterials. The L-shaped nanoprobe successfully acquired simultaneous a topographical image and an electrochemical current image of individual carbon nanotubes (CNTs) in a two-dimensional (2D) CNT network. Schematic diagram of an L-shaped nanoprobe for SECM-AFM: the nanoprobe has a triangular frame nanoelectrode and a protrusive insulating peak at the end of the AFM tip. ; close ; 0 ; 0 |
نوع الوثيقة: | article in journal/newspaper |
اللغة: | English |
تدمد: | 1862-6254 |
العلاقة: | PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, v.7, no.6, pp.406 - 409; https://scholarworks.unist.ac.kr/handle/201301/3272Test; http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=84879012908Test; 1026; 11043; 2-s2.0-84879012908; 000320174900008 |
DOI: | 10.1002/pssr.201307120 |
الإتاحة: | https://doi.org/10.1002/pssr.201307120Test https://scholarworks.unist.ac.kr/handle/201301/3272Test http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=84879012908Test |
رقم الانضمام: | edsbas.157548F2 |
قاعدة البيانات: | BASE |
تدمد: | 18626254 |
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DOI: | 10.1002/pssr.201307120 |