المؤلفون: Stachnik, K.¹ karolina.stachnik@desy.de, Mohacsi, I.², Vartiainen, I.², Stuebe, N.¹, Meyer, J.¹, Warmer, M.¹, David, C.², Meents, A.¹

المصدر: Applied Physics Letters. 7/6/2015, Vol. 107 Issue 1, p1-5. 5p. 1 Diagram, 3 Charts, 4 Graphs.

مصطلحات موضوعية: *COHERENCE (Optics), *DIFFRACTION patterns, *X-ray microscopy, *SPECTRUM analysis, *IMAGE reconstruction

المؤلفون: Mohacsi, I.^1,2, Petrik, P.¹ petrik@mfa.kfki.hu, Fried, M.¹, Lohner, T.¹, van den Berg, J.A.³, Reading, M.A.³, Giubertoni, D.⁴, Barozzi, M.⁴, Parisini, A.⁵

المصدر: Thin Solid Films. Feb2011, Vol. 519 Issue 9, p2847-2851. 5p.

مصطلحات موضوعية: *ION implantation, *SILICON, *DIELECTRICS, *ELLIPSOMETRY, *TRANSMISSION electron microscopy, *MONTE Carlo method, *SURFACE roughness, *ATOMIC force microscopy

المؤلفون: Makita, M.¹ mikako.makita@xfel.eu, Vartiainen, I.¹, Mohacsi, I.^1,2, Caleman, C.^3,4, Diaz, A.¹, Jönsson, H. O.^4,5, Juranić, P.¹, Medvedev, N.^6,7, Meents, A.³, Mozzanica, A.¹, Opara, N. L.^1,8, Padeste, C.¹, Panneels, V.¹, Saxena, V.^3,9, Sikorski, M.¹⁰, Song, S.¹⁰, Vera, L.¹, Willmott, P. R.¹, Beaud, P.¹, Milne, C. J.¹

المصدر: Scientific Reports. 1/24/2019, Vol. 9 Issue 1, p1-1. 1p.

المؤلفون: David, C.¹, Karvinen, P.¹, Sikorski, M.², Song, S.², Vartiainen, I.¹, Milne, C. J.¹, Mozzanica, A.¹, Kayser, Y.¹, Diaz, A.¹, Mohacsi, I.¹, Carini, G. A.², Herrmann, S.², Färm, E.³, Ritala, M.³, Fritz, D. M.², Robert, A.²

المصدر: Scientific Reports. 1/9/2015, p7644. 1p.

مصطلحات موضوعية: *PROPERTIES of matter, *FEMTOSECOND lasers research, *X-ray diffraction measurement, *X-ray scattering, *PRECISION (Information retrieval)