المؤلفون: Cortez, Mafalda¹, Hamdioui, Said¹, Kaichouhi, Ali², van der Leest, Vincent der³, Maes, Roel³, Schrijen, Geert-Jan³

المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems. Jul2015, Vol. 34 Issue 7, p1162-1175. 14p.

مصطلحات موضوعية: *SILICON research, *DECODERS (Electronics), *ADAPTERS (Telecommunication), *NOISE control research, *AMBIENT conditions (Electronics)

المؤلفون: Hamdioui, Said¹, Taouil, Mottaqiallah¹, Haron, Nor Zaidi²

المصدر: IEEE Transactions on Computers. Jan2015, Vol. 64 Issue 1, p247-259. 13p.

مصطلحات موضوعية: *MEMRISTORS, *DYNAMIC random access memory, *STATIC random access memory, *SEMICONDUCTORS, *COMPLEMENTARY metal oxide semiconductors

المؤلفون: Taouil, Mottaqiallah¹ M.Taouil@tudelft.nl, Hamdioui, Said¹ S.Hamdioui@tudelft.nl

المصدر: Journal of Electronic Testing. Aug2012, Vol. 28 Issue 4, p523-534. 12p.

مصطلحات موضوعية: *INTEGRATED circuits, *SEMICONDUCTOR wafers, *MICROPROCESSORS, *COMPUTER storage devices, *INDUSTRIAL costs

المؤلفون: Taouil, Mottaqiallah¹ M.Taouil@tudelft.nl, Hamdioui, Said¹ S.Hamdioui@tudelft.nl, Beenakker, Kees¹ C.I.M.Beenakker@tudelft.nl, Marinissen, Erik² erik.jan.marinissen@imec.be

المصدر: Journal of Electronic Testing. Feb2012, Vol. 28 Issue 1, p15-25. 11p.

مصطلحات موضوعية: *SEMICONDUCTOR wafers, *ALGEBRAIC stacks, *MICROELECTRONICS, *INTEGRATED circuits, *MANUFACTURING industries

المؤلفون: Al-Ars, Zaid¹ z.e.al-ars@ewi.tudelft.nl, Hamdioui, Said¹, Van De Goor, Ad J.¹, Al-Harbi, Sultan²

المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems. Dec2006, Vol. 25 Issue 12, p2989-2996. 8p. 1 Diagram, 4 Graphs.

مصطلحات موضوعية: *MAGNETIC coupling, *RANDOM access memory, *SIMULATION methods & models, *DELAY faults (Semiconductors), *INTEGRATED circuits, *COMPUTER systems

المؤلفون: Hamdioui, Said¹ S.Hamdioui@ewi.tudelft.nl, Al-Ars, Zaid¹ Z.Alars@ewi.tudelft.nl, van de Goor, Ad J.¹ A.J.vandeGoor@ewi.tudelft.nl

المصدر: IEEE Transactions on Computers. Dec2006, Vol. 55 Issue 12, p1630-1639. 10p. 3 Black and White Photographs, 7 Diagrams, 6 Charts, 1 Graph.

مصطلحات موضوعية: *DECODERS (Electronics), *RANDOM access memory, *DELAY faults (Semiconductors), *COMPUTER storage devices, *TESTING, *ELECTRONICS, *SEMICONDUCTOR industry, *PROCESS control systems, *MICROPROCESSORS

المؤلفون: Hamdioui, Said¹ S.Hamdioui@ewi.tudelft.nl, Delos Reyes, John Eleazar Q.²

المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems. Jun2005, Vol. 24 Issue 6, p892-904. 13p.

مصطلحات موضوعية: *RANDOM access memory, *VOCABULARY, *COMPUTER storage devices, *HIGH technology industries, *MAGNETIC memory (Computers), *FLASH memory

المؤلفون: Hamdioui, Said¹ S.Hamdioui@ewi.tudelft., Zaid Al-Ars¹, van de Goor, Ad J.¹, Rodgers, Mike²

المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems. May2004, Vol. 23 Issue 5, p737-757. 11p.

مصطلحات موضوعية: *RANDOM access memory, *COMPUTER storage devices, *FLASH memory, *ALGORITHMS, *INDUSTRIES, *COMPUTER-aided design

المؤلفون: Hamdioui, Said, van de Goor, Ad J.

المصدر: IEEE Transactions on Computers. May2002, Vol. 51 Issue 5, p460. 14p. 2 Black and White Photographs, 5 Diagrams, 6 Charts.

مصطلحات موضوعية: *FAULT-tolerant computing, *COMPUTER storage devices

المؤلفون: Hamdioui, Said, van de Goor, Ad J.

المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems. Feb2002, Vol. 21 Issue 2, p217. 15p. 9 Diagrams, 11 Charts.

مصطلحات موضوعية: *FUNCTIONAL differential equations, *SIMULATION methods & models, *PROBABILITY theory