المؤلفون: Ferrer, F. J.¹ fjferrer@us.es, Moreau, E.¹, Vignaud, D.¹ dominique.vignaud@univ-lille1.fr, Deresmes, D.¹, Godey, S.¹, Wallart, X.¹

المصدر: Journal of Applied Physics. Mar2011, Vol. 109 Issue 5, p054307. 6p. 2 Color Photographs, 1 Black and White Photograph, 1 Diagram, 2 Graphs.

مصطلحات موضوعية: *ELECTRON diffraction, *GRAPHITIZATION, *PHOTOEMISSION, *ATOMIC force microscopy, *GRAPHENE

المؤلفون: Ferrer, F. J.¹, Yubero, F.², Mejías, J. A.³, García-Lopez, F. J.¹, González-Elipe, A. R.²

المصدر: Journal of Applied Physics. Oct2007, Vol. 102 Issue 8, p084112. 7p. 1 Diagram, 4 Charts, 10 Graphs.

مصطلحات موضوعية: *THIN films, *PHOTOELECTRON spectroscopy, *POLARIZABILITY (Electricity), *SURFACES (Technology), *SILICON compounds

المؤلفون: Yubero, F.¹, Mansilla, C.¹, Ferrer, F. J.¹, Holgado, J. P.¹, González-Elipe, A. R.¹

المصدر: Journal of Applied Physics. 6/15/2007, Vol. 101 Issue 12, p124910. 6p. 1 Diagram, 1 Chart, 6 Graphs.

مصطلحات موضوعية: *NANOPARTICLES, *PHOTOELECTRON spectroscopy, *CATIONS, *ZIRCONIUM oxide, *SILICON oxide

المؤلفون: Moreau, E.¹, Godey, S.¹, Ferrer, F. J.¹, Vignaud, D.¹, Wallart, X.¹, Avila, J.², Asensio, M. C.², Bournel, F.³, Gallet, J.-J.³

المصدر: Applied Physics Letters. 12/13/2010, Vol. 97 Issue 24, p241907. 3p. 1 Color Photograph, 2 Diagrams, 1 Graph.

مصطلحات موضوعية: *CRYSTAL growth, *GRAPHENE, *MOLECULAR beam epitaxy, *SILICON carbide, *ATOMIC force microscopy, *LOW energy electron diffraction, *DIFFRACTION patterns, *CONDUCTION bands

المؤلفون: Godinho, V.¹ godinho@icmse.csic.es, Caballero-Hernández, J.¹, Jamon, D.^2,3, Rojas, T. C.¹, Schierholz, R.¹, García-López, J.⁴, Ferrer, F. J.⁴, Fernández, A.¹ asuncion@icmse.csic.es

المصدر: Nanotechnology. 2013, Vol. 24 Issue 27, p1-10. 10p.

مصطلحات موضوعية: *SILICON films, *POROUS materials, *NANOSTRUCTURES, *REFRACTIVE index, *MAGNETRON sputtering