التفاصيل البيبلوغرافية
| العنوان: |
Photoluminescence Imaging of Focused Ion Beam Induced Individual Quantum Dots. |
| المؤلفون: |
Jieun Lee1, Timothy W. Saucer1, Andrew J. Martin1, Deborah Tien1, Joanna M. Millunchick1, Vanessa Sih1 |
| المصدر: |
Nano Letters. Mar2011, Vol. 11 Issue 3, p1040-1043. 4p. |
| مصطلحات موضوعية: |
*PHOTOLUMINESCENCE, *IMAGING systems, *FOCUSED ion beams, *QUANTUM dots, *INDIUM arsenide, *MULTILAYERED thin films, *FIELD emission |
| مستخلص: |
We report on scanning microphotoluminescence measurements that spectrally and spatially resolve emission from individual InAs quantum dots that were induced by focused ion beam patterning. Multilayers of quantum dots were spaced 2 μm apart, with a minimum single dot emission line width of 160 μeV, indicating good optical quality for dots patterned using this technique. Mapping 16 array sites, at least 65% were occupied by optically active dots and the spectral inhomogeneity was within 30 meV. [ABSTRACT FROM AUTHOR] |
| قاعدة البيانات: |
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