التفاصيل البيبلوغرافية
| العنوان: |
An L-shaped nanoprobe for scanning electrochemical microscopy-atomic force microscopy. |
| المؤلفون: |
Lee, Eunjoo1, Kim, Minseo2, Seong, Jungwoo3, Shin, Heungjoo4 hjshin@unist.ac.kr, Lim, Geunbae2,3 limmems@postech.ac.kr |
| المصدر: |
Physica Status Solidi - Rapid Research Letters. Jun2013, Vol. 7 Issue 6, p406-409. 4p. |
| مصطلحات موضوعية: |
*NANOSTRUCTURES, *SCANNING electrochemical microscopy, *ATOMIC force microscopy, *ELECTROCHEMICAL analysis, *NANOSTRUCTURED materials |
| مستخلص: |
We present an L-shaped nanoprobe for scanning electrochemical microscopy-atomic force microscopy (SECM-AFM) capable of imaging the surface topography and the electrochemical activity of nanostructures of interest. Owing to the geometry of the protrusive peak in the L-shaped probe, the distance between the probe electrode and the substrate is maintained precisely at ∼100 nm during surface scanning. The reduction in electrode-to-substrate distance significantly improves the positive feedback current on top of the electrochemically active nanomaterials. The L-shaped nanoprobe successfully acquired simultaneous a topographical image and an electrochemical current image of individual carbon nanotubes (CNTs) in a two-dimensional (2D) CNT network. [ABSTRACT FROM AUTHOR] |
| قاعدة البيانات: |
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