تقرير
Optimal two-variable accelerated degradation test plan for gamma degradation process
| العنوان: | Optimal two-variable accelerated degradation test plan for gamma degradation process |
|---|---|
| المؤلفون: | Tzong-Ru Tsai, Wen-Yun Sung, Y. L. Lio, Shing I. Chang, Jye-Chyi Lu |
| بيانات النشر: | Institute of Electrical and Electronics Engineers |
| سنة النشر: | 2016 |
| المجموعة: | Tamkang University Institutional Repository (TKUIR) / 淡江大學機構典藏 |
| مصطلحات موضوعية: | inverse Gaussian distribution, Bonferroni's inequality, Brownian motion process, cumulative exposure model, gamma process, geometric Brownian motion process |
| الوصف: | An accelerated degradation test (ADT) can be used to assess the reliability of highly reliable products by using degradation information. In this study, to exhibit a monotone increasing pattern, the gamma process is used to model the degradation of a product subject to a constant-stress ADT of two loadings. Maximum likelihood estimates (MLEs) of the parameters of the ADT model were obtained. Given a budget for the total cost, an optimal ADT procedure was established to minimize the asymptotic variance of the MLE of the mean time to failure of a product, and the sample size and termination time of each run of the ADT at a constant measurement frequency were determined. An algorithm is provided to achieve an optimal ADT plan. An extensive Monte Carlo simulation was implemented to evaluate the sensitivity of the MLE variations to the sample size. A lumen degradation data set of light emitting diodes is presented to illustrate the proposed method. ; 補正完畢 |
| نوع الوثيقة: | report |
| وصف الملف: | 105 bytes; text/html |
| اللغة: | English |
| العلاقة: | IEEE Transactions on Reliability 65(1), p.459-468; 全文連結 PDF已下載 https://ieeexplore.ieee.org/abstract/document/7114339Test; 0018-9529; 1558-1721; http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/110018Test; http://tkuir.lib.tku.edu.tw:8080/dspace/bitstream/987654321/110018/1/index.htmlTest; http://tkuir.lib.tku.edu.tw:8080/dspace/bitstream/987654321/110018/-1/OptimalTest two-variable accelerated degradation test plan for gamma degradation process.pdf |
| الإتاحة: | http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/110018Test http://tkuir.lib.tku.edu.tw:8080/dspace/bitstream/987654321/110018/1/index.htmlTest http://tkuir.lib.tku.edu.tw:8080/dspace/bitstream/987654321/110018/-1/OptimalTest two-variable accelerated degradation test plan for gamma degradation process.pdf |
| رقم الانضمام: | edsbas.26F48A2 |
| قاعدة البيانات: | BASE |
| الوصف غير متاح. |