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1دورية أكاديمية
المؤلفون: Seong, Arim, Jeong, Donghwi, Kim, Minseo, Choi, Sihyuk, Kim, Guntae
العلاقة: JOURNAL OF POWER SOURCES, v.530, pp.231241; https://scholarworks.unist.ac.kr/handle/201301/61150Test; 40778; 2-s2.0-85126091153; 000783079400004; https://www.sciencedirect.com/science/article/pii/S0378775322002592?via%3DihubTest
الإتاحة: https://doi.org/10.1016/j.jpowsour.2022.231241Test
https://scholarworks.unist.ac.kr/handle/201301/61150Test
https://www.sciencedirect.com/science/article/pii/S0378775322002592?via%3DihubTest -
2دورية أكاديمية
المؤلفون: Kim, Minseo, Ha, Unsoo, Lee, Kyuho Jason, Lee, Yongsu, Yoo, Hoi-Jun
العلاقة: IEEE JOURNAL OF SOLID-STATE CIRCUITS, v.52, no.7, pp.1953 - 1965; https://ieeexplore.ieee.org/document/7919157Test/; https://scholarworks.unist.ac.kr/handle/201301/24537Test; 3698; 30711; 2-s2.0-85018914009; 000404301300020
الإتاحة: https://doi.org/10.1109/JSSC.2017.2694833Test
https://scholarworks.unist.ac.kr/handle/201301/24537Test
https://ieeexplore.ieee.org/document/7919157Test/ -
3دورية أكاديمية
المؤلفون: Kim, Minseo, Jang, Jaeeun, Kim, Hyunki, Lee, Jihee, Lee, Jaehyuck, Lee, Jiwon, Lee, Kyoung-Rog, Kim, Kwantae, Lee, Yongsu, Lee, Kyuho Jason, Yoo, Hoi-Jun
العلاقة: IEEE JOURNAL OF SOLID-STATE CIRCUITS, v.52, no.11, pp.2829 - 2842; https://ieeexplore.ieee.org/document/8057579Test/; https://scholarworks.unist.ac.kr/handle/201301/24536Test; 3698; 30710; 2-s2.0-85031790706; 000413941800004
الإتاحة: https://doi.org/10.1109/JSSC.2017.2753234Test
https://scholarworks.unist.ac.kr/handle/201301/24536Test
https://ieeexplore.ieee.org/document/8057579Test/ -
4دورية أكاديمية
المؤلفون: Cho, Hyunwoo, Kim, Hyunki, Kim, Minseo, Jang, Jaeeun, Lee, Yongsu, Lee, Kyuho Jason, Bae, Joonsung, Yoo, Hoi-Jun
العلاقة: IEEE JOURNAL OF SOLID-STATE CIRCUITS, v.51, no.1, pp.310 - 317; https://ieeexplore.ieee.org/document/7362129Test/; https://scholarworks.unist.ac.kr/handle/201301/24528Test; 3698; 30715; 2-s2.0-84971003292; 000367719400030
الإتاحة: https://doi.org/10.1109/JSSC.2015.2498761Test
https://scholarworks.unist.ac.kr/handle/201301/24528Test
https://ieeexplore.ieee.org/document/7362129Test/ -
5مؤتمر
المؤلفون: Kim, Minseo, Ha, Unsoo, Lee, Yongsu, Lee, Kyuho, Yoo, Hoi-Jun
العلاقة: European Solid-State Circuits Conference, pp.157 - 160; https://scholarworks.unist.ac.kr/handle/201301/35382Test; 18523; 2-s2.0-84994418042; https://ieeexplore.ieee.org/document/7598266Test/
الإتاحة: https://doi.org/10.1109/ESSCIRC.2016.7598266Test
https://scholarworks.unist.ac.kr/handle/201301/35382Test
https://ieeexplore.ieee.org/document/7598266Test/ -
6دورية أكاديمية
المؤلفون: Lee, Eunjoo, Kim, Minseo, Seong, Jungwoo, Shin, Heungjoo, Lim, Geunbae
مصطلحات موضوعية: AFM, Electrochemical activities, Electrochemical currents, Force microscopy, Scanning electrochemical microscopy, SECM, Surface scanning, Topographical images
العلاقة: PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, v.7, no.6, pp.406 - 409; https://scholarworks.unist.ac.kr/handle/201301/3272Test; http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=84879012908Test; 1026; 11043; 2-s2.0-84879012908; 000320174900008
الإتاحة: https://doi.org/10.1002/pssr.201307120Test
https://scholarworks.unist.ac.kr/handle/201301/3272Test
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=84879012908Test
