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1دورية أكاديمية
المؤلفون: Besendörfer, S., Meissner, E., Medjoub, F., Derluyn, J., Friedrich, J., Erlbacher, T.
مصطلحات موضوعية: aluminum gallium nitride, high electron mobility transistors, MIS (Semiconductor)
الوقت: 670, 620, 530
العلاقة: Scientific Reports; https://publica.fraunhofer.de/handle/publica/264740Test
الإتاحة: https://doi.org/10.1038/s41598-020-73977-2Test
https://publica.fraunhofer.de/handle/publica/264740Test -
2مؤتمر
المؤلفون: Jauss, S.A., Schwaiger, S., Daves, W., Noll, S., Ambacher, Oliver
مصطلحات موضوعية: GaN, MIS-HEMT, current collapse, drain stress, access region, traps
العلاقة: European Solid-State Device Research Conference (ESSDERC) 2015; 45th European Solid-State Device Research Conference, ESSDERC 2015. Proceedings; https://publica.fraunhofer.de/handle/publica/390843Test
الإتاحة: https://doi.org/10.1109/ESSDERC.2015.7324712Test
https://publica.fraunhofer.de/handle/publica/390843Test -
3دورية أكاديمية
المؤلفون: Rouag, N., Ouennoughi, Zahir, Rommel, Mathias, Murakami, Katsuhisa, Frey, Lothar
مصطلحات موضوعية: MIS, Poole-Frenkel, temperature dependence, current conduction mechanisms, optimization method
الوقت: 621
العلاقة: Microelectronics reliability; https://publica.fraunhofer.de/handle/publica/239862Test
الإتاحة: https://doi.org/10.1016/j.microrel.2015.05.001Test
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4مؤتمر
المؤلفون: Feldmann, F., Bivour, M., Reichel, C., Hermle, M., Glunz, S.W.
مصطلحات موضوعية: Solarzellen - Entwicklung und Charakterisierung, Silicium-Photovoltaik, Herstellung und Analyse von hocheffizienten Solarzellen, Modulintegration, MIS, n-type, contact
وصف الملف: application/pdf
العلاقة: European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC) 2013; 28th European Photovoltaic Solar Energy Conference and Exhibition, EU PVSEC 2013. Proceedings. DVD-ROM; https://publica.fraunhofer.de/handle/publica/381535Test
الإتاحة: https://doi.org/10.4229/28thEUPVSEC2013-2CO.4.4Test
https://publica.fraunhofer.de/handle/publica/381535Test -
5مؤتمر
المؤلفون: Noborio, M., Grieb, M., Bauer, A.J., Peters, D., Friedrichs, P., Suda, J., Kimoto, T.
مصطلحات موضوعية: MIS, MOS, MISFET, MOSFET, interface state density, channel mobility, charge-to-breakdown, TDDB, deposited oxide, SiNx, N2O, nitridation
الوقت: 670, 620, 530
العلاقة: International Conference on Silicon Carbide and Related Materials (ICSCRM) 2009; Silicon carbide and related materials 2009; https://publica.fraunhofer.de/handle/publica/367973Test
الإتاحة: https://doi.org/10.4028/www.scientific.net/MSF.645-648.825Test
https://publica.fraunhofer.de/handle/publica/367973Test -
6دورية أكاديمية
مصطلحات موضوعية: dark conductivity, elemental semiconductors, MIS devices, p-n junctions, scanning electron microscopy, semiconductor device breakdown, silicon, silicon compounds, silver, solar cells, tunnelling
الوقت: 621, 697, 530
العلاقة: Journal of applied physics; https://publica.fraunhofer.de/handle/publica/232261Test
الإتاحة: https://doi.org/10.1063/1.4807931Test
https://publica.fraunhofer.de/handle/publica/232261Test -
7مؤتمر
مصطلحات موضوعية: catalogue system, geospatial data, information retrieval, metadata, metadata information system, MIS
الوقت: 006
العلاقة: International Workshop on Advances in Geographic Information Systems (GIS) 1998; ACM GIS '98. Proceedings of the 6th International Symposium on Advances in Geographic Information Systems; https://publica.fraunhofer.de/handle/publica/330317Test
الإتاحة: https://doi.org/10.1145/288692.288710Test
https://publica.fraunhofer.de/handle/publica/330317Test -
8دورية أكاديمية
المؤلفون: Leistner, T., Lehmbacher, K., Härter, P., Schmidt, C., Bauer, A.J., Frey, L., Ryssel, H.
مصطلحات موضوعية: MOCVD, titanium dioxide, precursor, MIS structure
الوقت: 670, 620, 530
العلاقة: Journal of non-crystalline solids; https://publica.fraunhofer.de/handle/publica/201666Test
الإتاحة: https://doi.org/10.1016/S0022-3093Test(02)00965-1
https://publica.fraunhofer.de/handle/publica/201666Test -
9دورية أكاديمية
المؤلفون: Esquivias, I., Baars, J., Brink, D., Eger, D.
مصطلحات موضوعية: anodic oxide, anodisches Oxid, electrical property, elektrische Eigenschaft, HgZnTe, MIS
الوقت: 621, 667, 530
العلاقة: Semiconductor Science and Technology; https://publica.fraunhofer.de/handle/publica/182784Test
الإتاحة: https://doi.org/10.1088/0268-1242/8/1S/016Test
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10رسالة جامعية
المؤلفون: Lemberger, M.
مصطلحات موضوعية: Mikroelektronik, Halbleitertechnologie, MOCVD-Verfahren, Ausgangsmaterial, MIS, High-k-Dielektrikum, Halbleitergrenzfläche, Hafniumsilicat, Zirconiumsilicat, Titanat, Siliciumscheiben, Germaniumscheiben
الوقت: 670, 620, 530