المؤلفون: Chien, Yu-Chieh, Chang, Ting-Chang, Chiang, Hsiao-Cheng, Chen, Hua-Mao, Tsao, Yu-Ching, Shih, Chih-Cheng, Chen, Bo-Wei, Liao, Po-Yung, Chu, Ting-Yang, Yang, Yi-Chieh, Hung, Yu-Ju, Tsai, Tsung-Ming, Chang, Kuan-Chang

المساهمون: Chang, TC (reprint author), Natl Sun Yat Sen Univ, Dept Phys, Kaohsiung 80424, Taiwan., Chang, TC (reprint author), Natl Cheng Kung Univ, Adv Optoelect Technol Ctr, Tainan 800, Taiwan., Chang, KC (reprint author), Peking Univ, Sch Elect & Comp Engn, Beijing 518005, Peoples R China., Sun Yat Sen Univ, Dept Mat & Optoelect, Kaohsiung 80424, Taiwan., Natl Sun Yat Sen Univ, Dept Phys, Kaohsiung 80424, Taiwan., Natl Cheng Kung Univ, Adv Optoelect Technol Ctr, Tainan 800, Taiwan., Natl Chiao Tung Univ, Inst Electroopt Engn, Dept Photon, Hsinchu 300, Taiwan., Natl Sun Yat Sen Univ, Dept Photon, Kaohsiung 80424, Taiwan., Peking Univ, Sch Elect & Comp Engn, Beijing 518005, Peoples R China.

المصدر: SCI

مصطلحات موضوعية: A-InGaZnO TFTs, moisture ambient, hydrogen atoms bonding, bias reliability, ZINC-OXIDE, HYDROGEN, PERFORMANCE

العلاقة: IEEE ELECTRON DEVICE LETTERS.2017,38(4),469-472.; 1908646; http://hdl.handle.net/20.500.11897/474290Test; WOS:000398905400015

الإتاحة: https://doi.org/20.500.11897/474290Test
https://doi.org/10.1109/LED.2017.2666198Test
https://hdl.handle.net/20.500.11897/474290Test

المؤلفون: Chen, Bo-Wei, Chen, Hsin-Lu, Chang, Ting-Chang, Hung, Yu-Ju, Huang, Shin-Ping, Zheng, Yu-Zhe, Lin, Yu-Ho, Liao, Po-Yung, Chen, Li-Hui, Yang, Jian-Wen, Chiang, Hsiao-Cheng, Su, Wan-Ching, Tsao, Yu-Ching, Chu, Ann-Kuo, Li, Hung-Wei, Tsai, Chih-Hung, Lu, Hsueh-Hsing, Chang, Kuan-Chang, Young, Tai-Fa

المساهمون: Chang, TC (reprint author), Natl Sun Yat Sen Univ, Dept Phys, Kaohsiung 80424, Taiwan., Natl Sun Yat Sen Univ, Dept Photon, Kaohsiung 80424, Taiwan., Natl Sun Yat Sen Univ, Dept Mech & Electromech Engn, Kaohsiung 80424, Taiwan., Natl Sun Yat Sen Univ, Dept Phys, Kaohsiung 80424, Taiwan., Natl Cheng Kung Univ, Adv Optoelect Technol Ctr, Tainana 701, Taiwan., Natl Sun Yat Sen Univ, Dept Chem, Kaohsiung 80424, Taiwan., Fudan Univ, Dept Mat Sci, Shanghai 200433, Peoples R China., Natl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 80424, Taiwan., AU Optron Co Ltd, New Display Proc Res Div, Hsinchu 300, Taiwan., Peking Univ, Sch Elect & Comp Engn, Shenzhen 518005, Peoples R China.

المصدر: SCI

مصطلحات موضوعية: Flexible low-temperature polycrystalline-silicon thin-film transistors (LTPS TFTs), negative-bias temperature instability (NBTI), self-heating effects, THIN-FILM TRANSISTORS, BIAS TEMPERATURE INSTABILITY, HEATING-RELATED INSTABILITY, NBTI DEGRADATION, MOSFETS, TFTS

العلاقة: IEEE TRANSACTIONS ON ELECTRON DEVICES.2017,64(8),3167-3173.; 1905905; http://hdl.handle.net/20.500.11897/471802Test; WOS:000406268900018

الإتاحة: https://doi.org/20.500.11897/471802Test
https://doi.org/10.1109/TED.2017.2715500Test
https://hdl.handle.net/20.500.11897/471802Test

المؤلفون: Chiang, Hsiao-Cheng, Chang, Ting-Chang, Liao, Po-Yung, Chen, Bo-Wei, Tsao, Yu-Ching, Tsai, Tsung-Ming, Chien, Yu-Chieh, Yang, Yi-Chieh, Chen, Kuan-Fu, Yang, Chung-I, Hung, Yu-Ju, Chang, Kuan-Chang, Zhang, Sheng-Dong, Lin, Sung-Chun, Yeh, Cheng-Yen

المساهمون: Chang, TC (reprint author), Natl Sun Yat Sen Univ, Dept Phys, Kaohsiung 80424, Taiwan., Chang, TC (reprint author), Natl Cheng Kung Univ, Adv Optoelect Technol Ctr, Tainan 70101, Taiwan., Natl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 80424, Taiwan., Natl Sun Yat Sen Univ, Dept Phys, Kaohsiung 80424, Taiwan., Natl Cheng Kung Univ, Adv Optoelect Technol Ctr, Tainan 70101, Taiwan., Natl Sun Yat Sen Univ, Dept Photon, Kaohsiung 80424, Taiwan., Natl Chiao Tung Univ, Dept Electrophys, Hsinchu 30010, Taiwan., Peking Univ, Dept Elect & Comp Engn, Shenzhen 518055, Peoples R China., HannStar Display Corp, New Technol Dev, Tainan 74199, Taiwan.

المصدر: SCI

مصطلحات موضوعية: IGZO TFTS, ZNO-CU, SEMICONDUCTORS, TRANSITIONS, IMPURITIES, OXIDE, SHIFT

العلاقة: APPLIED PHYSICS LETTERS.2017,111(13).; 1904782; http://hdl.handle.net/20.500.11897/470758Test; WOS:000412074000043

الإتاحة: https://doi.org/20.500.11897/470758Test
https://doi.org/10.1063/1.5004526Test
https://hdl.handle.net/20.500.11897/470758Test