دورية أكاديمية
Planar waveguides in BiB3O6 and Nd : YVO4 crystals by ion implantation
| العنوان: | Planar waveguides in BiB3O6 and Nd : YVO4 crystals by ion implantation |
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| المؤلفون: | Chen, F, Wang, XL, Wang, KM, Lu, QM, Teng, B, Shen, DY |
| المساهمون: | Chen, F (reprint author), Shandong Univ, Dept Phys, Jinan 250100, Shandong, Peoples R China., Shandong Univ, Dept Phys, Jinan 250100, Shandong, Peoples R China., Shandong Univ, Sch Chem, Jinan 250100, Shandong, Peoples R China., Shandong Univ, Inst Crystal Mat, Jinan 250100, Shandong, Peoples R China., Peking Univ, Minist Educ, Dept Tech Phys, Beijing 100871, Peoples R China., Peking Univ, Minist Educ, Key Lab Heavy Ion Phys, Beijing 100871, Peoples R China. |
| المصدر: | SCI ; EI |
| بيانات النشر: | 应用表面科学 |
| سنة النشر: | 2002 |
| المجموعة: | Peking University Institutional Repository (PKU IR) / 北京大学机构知识库 |
| مصطلحات موضوعية: | planar waveguides, ion implantation, refractive index profile, BiB3O6, Nd : YVO4, WAVE-GUIDES, OPTICS |
| الوصف: | BiB3O6 and Nd:YVO4 planar waveguides were fabricated by MeV Si+ (with a dose of 1 x 10(14) ions/cm(2)) and Cu+ (with a dose of 1 x 10(15) ions/cm(2)) ion implantation, respectively. Prism coupling method was used to observe the dark modes of the BiB3O6 and Nd:YVO4 waveguides. Reflectivity calculation method (RCM) was applied to simulate the refractive index profiles in the guiding layer. Obvious positive refractive index changes in the surface layer were induced by the ion implantation, which confined the region beneath the surface for many microns to be waveguide structures. (C) 2002 Elsevier Science B.V. All rights reserved. ; Chemistry, Physical ; Materials Science, Coatings & Films ; Physics, Applied ; Physics, Condensed Matter ; SCI(E) ; EI ; 9 ; ARTICLE ; 1-4 ; 61-66 ; 191 |
| نوع الوثيقة: | journal/newspaper |
| اللغة: | English |
| تدمد: | 0169-4332 |
| العلاقة: | APPLIED SURFACE SCIENCE.2002,191,(1-4),61-66.; 763093; http://hdl.handle.net/20.500.11897/208907Test; WOS:000176970300008 |
| DOI: | 10.1016/S0169-4332(02)00155-1 |
| الإتاحة: | https://doi.org/20.500.11897/208907Test https://doi.org/10.1016/S0169-4332Test(02)00155-1 https://hdl.handle.net/20.500.11897/208907Test |
| رقم الانضمام: | edsbas.6E292535 |
| قاعدة البيانات: | BASE |
| تدمد: | 01694332 |
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| DOI: | 10.1016/S0169-4332(02)00155-1 |