-
1دورية أكاديمية
المؤلفون: Jin, K., Zhang, Y., Zhu, Z., Grove, D. A., Xue, H., Xue, J., Weber, W. J.
المساهمون: Zhang, Y (reprint author), Univ Tennessee, Dept Mat Sci & Engn, Knoxville, TN 37996 USA., Univ Tennessee, Dept Mat Sci & Engn, Knoxville, TN 37996 USA., Oak Ridge Natl Lab, Mat Sci & Technol Div, Oak Ridge, TN 37831 USA., Pacific NW Natl Lab, Richland, WA 99352 USA., Luxel Corp, Friday Harbor, WA 98250 USA., Peking Univ, Sch Phys, State Key Lab Nucl Phys & Technol, Beijing 100871, Peoples R China.
المصدر: SCI ; EI
مصطلحات موضوعية: LEVEL NUCLEAR-WASTE, SILICON-CARBIDE, RANGE PROFILES, IMMOBILIZATION, SIMULATION, DETECTOR, SURFACE, SOLIDS, CODE, AU
العلاقة: JOURNAL OF APPLIED PHYSICS.2014,115,(4).; 798457; http://hdl.handle.net/20.500.11897/218087Test; WOS:000331210800125
الإتاحة: https://doi.org/20.500.11897/218087Test
https://doi.org/10.1063/1.4861642Test
https://hdl.handle.net/20.500.11897/218087Test -
2مؤتمر
المساهمون: Shi, H (reprint author), Peking Univ, Inst Microelect, Beijing 100871, Peoples R China., Peking Univ, Inst Microelect, Beijing 100871, Peoples R China.
المصدر: SCI ; EI
مصطلحات موضوعية: HfO2, ion implantation, molecular dynamics, Monte Carlo, range profiles, simulation
العلاقة: FIFTH INTERNATIONAL CONFERENCE ON THIN FILM PHYSICS AND APPLICATIONS.5774(176-179).; 1061687; http://hdl.handle.net/20.500.11897/293804Test; WOS:000226292200039
الإتاحة: https://doi.org/20.500.11897/293804Test
https://doi.org/10.1117/12.607558Test
https://hdl.handle.net/20.500.11897/293804Test
