المؤلفون: M. A. Domínguez, J. L. Ausín, J. F. Duque Carrillo, TORELLI, GUIDO

المساهمون: M. A., Domínguez, J. L., Ausín, Torelli, Guido, J. F., Duque Carrillo

مصطلحات موضوعية: ANALOG INTEGRATED CIRCUITS, SWITCHED-CAPACITOR CIRCUITS, SINE-WAVE OSCILLATOR, BUILT-IN SELF TESTING, NOISE SHAPING MODULATION

وصف الملف: ELETTRONICO

العلاقة: info:eu-repo/semantics/altIdentifier/isbn/9788469086292; ispartofbook:Proceedings XXII Conference on Design of Circuits and Integrated Systems; XXII Conference on Design of Circuits and Integrated Systems (DCIS '07); firstpage:146; lastpage:150; numberofpages:5; http://hdl.handle.net/11571/33155Test

الإتاحة: http://hdl.handle.net/11571/33155Test

المؤلفون: M. A. Domínguez, J. L. Ausín, J. F. Duque Carillo, TORELLI, GUIDO

المساهمون: M. A., Domínguez, J. L., Ausín, J. F., Duque Carillo, Torelli, Guido

مصطلحات موضوعية: ANALOG INTEGRATED CIRCUITS, SWITCHED-CAPACITOR CIRCUITS, SINE-WAVE OSCILLATOR, BUILT-IN SELF TESTING

وصف الملف: STAMPA

العلاقة: info:eu-repo/semantics/altIdentifier/isbn/9780780393899; info:eu-repo/semantics/altIdentifier/wos/WOS:000245413503209; ispartofbook:Proceedings 2006 IEEE International Symposium on Circuits and Systems; IEEE International Symposium on Circuits and Systems (ISCAS '06); firstpage:3454; lastpage:3457; numberofpages:4; http://hdl.handle.net/11571/29302Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-34547293424

الإتاحة: https://doi.org/10.1109/ISCAS.2006.1693369Test
http://hdl.handle.net/11571/29302Test

المؤلفون: M. A. Domínguez, J. L. Ausín, J. F. Duque Carrillo, TORELLI, GUIDO

المساهمون: M. A., Domínguez, J. L., Ausín, Torelli, Guido, J. F., Duque Carrillo

مصطلحات موضوعية: CMOS ANALOG CIRCUITS, BUILT-IN SELF TESTING, ON-CHIP SPECTRUM ANALYZER

وصف الملف: STAMPA

العلاقة: info:eu-repo/semantics/altIdentifier/isbn/9780780387157; info:eu-repo/semantics/altIdentifier/wos/WOS:000228424500153; ispartofbook:Proceedings 11th IEEE International Conference on Electronics, Circuits and Systems; IEEE International Conference on Electronics, Circuits and Systems (ICECS '04); volume:1; firstpage:595; lastpage:598; numberofpages:4; http://hdl.handle.net/11571/151682Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-27644516803

الإتاحة: https://doi.org/10.1109/ICECS.2004.1399751Test
http://hdl.handle.net/11571/151682Test

المؤلفون: M. A. Domínguez, J. L. Ausín, J. F. Duque Carrillo, TORELLI, GUIDO

المساهمون: M. A., Domínguez, J. L., Ausín, Torelli, Guido, J. F., Duque Carrillo

مصطلحات موضوعية: CMOS ANALOG CIRCUITS, BUILT-IN SELF TESTING, ON-CHIP SPECTRUM ANALYZER

وصف الملف: ELETTRONICO

العلاقة: info:eu-repo/semantics/altIdentifier/isbn/2-9522971-0-X; ispartofbook:Proceedings XIX Conference on Design of Circuits and Integrated Systems; Conference on Design of Circuits and Integrated Systems (DCIS '04); firstpage:579; lastpage:584; numberofpages:6; http://hdl.handle.net/11571/151689Test

الإتاحة: http://hdl.handle.net/11571/151689Test

المؤلفون: C. A. Leme, J. E. Franca, M. S. Piedade, MALOBERTI, FRANCO

المساهمون: C. A., Leme, J. E., Franca, Maloberti, Franco, M. S., Piedade

مصطلحات موضوعية: A-D CONVERSION, D-A CONVERSION, SELF TESTING CAPABILITY

وصف الملف: STAMPA

العلاقة: ispartofbook:Proceedings of the fourteenth European Solid-State Circuits Conference; European Solid-State Circuits Conference (ESSCIRC 88); firstpage:37; lastpage:41; http://hdl.handle.net/11571/145733Test

الإتاحة: http://hdl.handle.net/11571/145733Test