المؤلفون: Herrero-Bermello, A., Velasco, Aitor V., Podmore, Hugh, Cheben, Pavel, Schmid, Jens H., Janz, S., Calvo, María L., Xu, D.X., Scott, Alan, Corredera, Pedro

المساهمون: Comunidad de Madrid, Ministerio de Economía y Competitividad (España), European Commission, European Metrology Research Programme, National Research Council of Canada

العلاقة: #PLACEHOLDER_PARENT_METADATA_VALUE#; info:eu-repo/grantAgreement/EC/H2020/734331; info:eu-repo/grantAgreement/MINECO/Plan Estatal de Investigación Científica y Técnica y de Innovación 2013-2016/FJCI-2014-22836; info:eu-repo/grantAgreement/MINECO/Plan Estatal de Investigación Científica y Técnica y de Innovación 2013-2016/TEC2015-71127-C2-1-R; info:eu-repo/grantAgreement/MINECO/Plan Estatal de Investigación Científica y Técnica y de Innovación 2013-2016/TEC2015-71127-C2-2-R; S2013/MIT-2790/SINFOTON-CM; Postprint; https://doi.org/10.1364/OL.42.002239Test; Sí; Optics Letters 42(11): 2239-2242 (2017); http://hdl.handle.net/10261/164048Test; http://dx.doi.org/10.13039/501100000046Test; http://dx.doi.org/10.13039/501100003329Test; http://dx.doi.org/10.13039/501100000780Test; http://dx.doi.org/10.13039/100012818Test

الإتاحة: https://doi.org/10.1364/OL.42.002239Test
https://doi.org/10.13039/501100000046Test
https://doi.org/10.13039/501100003329Test
https://doi.org/10.13039/501100000780Test
https://doi.org/10.13039/100012818Test
http://hdl.handle.net/10261/164048Test

المؤلفون: Velasco, Aitor V., Galindo Santos, Juan, Cheben, Pavel, Calvo, María L., Schmid, J., Delage, A., Xu, D.X., Janz, S., Corredera, Pedro

المساهمون: Ministerio de Economía y Competitividad (España), Comunidad de Madrid, European Metrology Research Programme

مصطلحات موضوعية: Spectral retrieval, Temperature drift, Silicon on insulator, Fourier transform, Integrated optics, Spectroscopy

العلاقة: #PLACEHOLDER_PARENT_METADATA_VALUE#; S2013/MIT-2790/SINFOTON; Publisher's version; http://dx.doi.org/10.7149/OPA.48.4.283Test; Sí; Optica Pura y Aplicada 48: 283- 289 (2015); http://hdl.handle.net/10261/134917Test; http://dx.doi.org/10.13039/501100003329Test; http://dx.doi.org/10.13039/100012818Test

الإتاحة: https://doi.org/10.7149/OPA.48.4.283Test
https://doi.org/10.13039/501100003329Test
https://doi.org/10.13039/100012818Test
http://hdl.handle.net/10261/134917Test

المؤلفون: Cheben, Pavel, Schmid, J. H., Halir, R., Alonso-Ramos, Carlos, Benedikovic, D., Sánchez Postigo, Alejandro, Luque-González, José Manuel, González-Andrade, D., Pereira-Martín, Daniel, Čtyroký, Jiří, Melati, D., Grinberg, Y., Ortega-Moñux, A., Wangüemert-Pérez, J. G., Molina-Fernández, Iñigo, Velasco, Aitor V., Herrero-Bermello, A., Lapointe, J., Janz, S., Xu, D. X., Cheriton, R., Kamandar, M., Wang, S., Vachon, M., Vivien, L., Ye, W. N., Litvik, J., Dado, M.

العلاقة: Sí; IEEE Photonics Conference (2019); http://hdl.handle.net/10261/213419Test

الإتاحة: http://hdl.handle.net/10261/213419Test

المؤلفون: Cheben, Pavel, Podmore, H., Herrero-Bermello, A., Velasco, Aitor V., Schmid, J. H., Scott, A., Vachon, M., Lee, R., Calvo, María L., Xu, D.X., Janz, S., Corredera, Pedro

العلاقة: http://doi.org/10.1109/ICTON.2017.8024928Test; Sí; e-issn: 2161-2064; 19th International Conference on Transparent Optical Networks (ICTON) (2017); http://hdl.handle.net/10261/167676Test

الإتاحة: https://doi.org/10.1109/ICTON.2017.8024928Test
http://hdl.handle.net/10261/167676Test

المؤلفون: Zoogman, P., Liu, X., Suleiman, R. M., Pennington, W. F., Flittner, D. E., Al-Saadi, J. A., Hilton, B. B., Nicks, D. K., Newchurch, M. J., Carr, J. L., Janz, S. J., Andraschko, M. R., Arola, A., Baker, B. D., Canova, B. P., Chan Miller, C., Cohen, R. C., Davis, J. E., Dussault, M. E., Edwards, D. P., Fishman, J., Ghulam, A., González Abad, G., Grutter, M., Herman, J. R., Houck, J., Jacob, Daniel J., Joiner, J., Kerridge, B. J., Kim, J., Krotkov, N. A., Lamsal, L., Li, C., Lindfors, A., Martin, R. V., McElroy, C. T., McLinden, C., Natraj, V., Neil, D. O., Nowlan, C. R., O'Sullivan, E. J., Palmer, P. I., Pierce, R. B., Pippin, M. R., Saiz-Lopez, A., Spurr, R. J. D., Szykman, J. J., Torres, O., Veefkind, J. P.

العلاقة: Sí; Journal of Quantitative Spectroscopy and Radiative Transfer 186: 17- 39 (2017); http://hdl.handle.net/10261/165914Test

الإتاحة: https://doi.org/10.1016/j.jqsrt.2016.05.008Test
http://hdl.handle.net/10261/165914Test

المؤلفون: Velasco, Aitor V., Cheben, Pavel, Calvo, María L., Delage, A., Schmid, Jens H., Lapointe, J., Vachon, M. Nedeljokovic, M., Khokhar, Ali Z., Mashanovich, Goran Z., Herrero-Bermello, A., Corredera, Pedro, Janz, S., Xu, Dan-Xia

مصطلحات موضوعية: Silicon, Refractive index, Optical waveguides, Optical arrays, Micro-optics, Integrated optics, Silicon-on-insulator, Elemental semiconductors, Fourier transform spectrometers, Infrared spectrometers

العلاقة: Sí; PIERS (2016); http://hdl.handle.net/10261/154548Test

الإتاحة: https://doi.org/10.1109/PIERS.2016.7734234Test
http://hdl.handle.net/10261/154548Test