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1
المؤلفون: Xu, B., Lipworth, L., Wide, Leif, Wuu, J., Yu, S.Z., Lagiou, P., Kuper, H., Hankinson, S.E., Carlström, K., Adami, Hans-Olov, Trichopoulos, D., Hsieh, C.C.
المصدر: European Journal of Cancer Prevention. 12(1):35-42
مصطلحات موضوعية: Growth hormone, maternal characteristics, perinatal characteristics, pregnancy, prolactin, MEDICINE, MEDICIN
وصف الملف: print
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2
المؤلفون: Thurfjell, Erik, Hsieh, C.C., Lipworth, L., Ekbom, A., Adami, Hans-Olov, Trichopoulos, D.
المصدر: European Journal of Cancer Prevention. 5(1):37-41
وصف الملف: print
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3دورية أكاديمية
المؤلفون: Hsieh, C.C.1, Ke, C.1 cke@swjtu.edu.cn, Zhou, D.J.2, Cheng, C.H.1,3, Zhang, H.4, Zhao, Y.1,2 zhaoyong@fjnu.edu.cn
المصدر: Journal of Alloys & Compounds. May2018, Vol. 745, p460-466. 7p.
مصطلحات موضوعية: *SUPERCONDUCTING transition temperature, *SUPERCONDUCTIVITY, *ELECTRICAL resistivity, *ELECTRON scattering, *TRANSITION metal alloys, *HIGH temperature superconductivity
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4دورية أكاديمية
المصدر: Journal of Crystal Growth. Jun2015, Vol. 419, p1-6. 6p.
مصطلحات موضوعية: *SILICON, *CRYSTAL defects, *CRYSTAL growth, *CRYSTAL orientation, *SOLIDIFICATION
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5مؤتمر
المؤلفون: Wei, C.C., Yu, C.H., Tung, C.H., Huang, R.Y., Hsieh, C.C., Chiu, C.C., Hsiao, H.Y., Chang, Y.W., Lin, C.K., Liang, Y.C., Chen, C., Yeh, T.C., Lin, L.C., Yu, D.C.H.
المصدر: 2011 IEEE 61st Electronic Components & Technology Conference (ECTC); 2011, p706-710, 5p
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6مؤتمر
المؤلفون: Lin, Y.J., Hsieh, C.C., Yu, C.H., Tung, C.H., Yu, D.C.H.
المصدر: 2011 IEEE 61st Electronic Components & Technology Conference (ECTC); 2011, p634-638, 5p
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7مؤتمر
المؤلفون: Pan, C.T., Hsieh, C.C., Lin, S.C.
المصدر: 2006 1st IEEE International Conference on Nano/Micro Engineered & Molecular Systems; 2006, p1064-1067, 4p
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8مؤتمر
المؤلفون: Hsieh, C.C., Hsu, P.L.
المصدر: 2005 IEEE International Conference on Systems, Man & Cybernetics; 2005, p1314-1319, 6p
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9مؤتمر
المؤلفون: Chen, M.J., Shih, J.R., Yu, K.F., Hsieh, C.C., Sung, W.L., Lin, F.S., Chu, L.H., Shiue, R.Y., Peng, Y.K., Yue, J.T.
المصدر: 2001 6th International Symposium on Plasma- & Process-Induced Damage (IEEE Cat. No.01TH8538); 2001, p12-15, 4p
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10دورية أكاديمية
المؤلفون: Liu, Z.1,2,3 zliu@nimte.ac.cn, Hsieh, C.C.2, Chen, R.J.1,3, Lin, W.C.2, Chang, H.W.4, Chang, W.C.2 phywcc@ccu.edu.tw, Yan, A.R.1,3
المصدر: Journal of Magnetism & Magnetic Materials. Jan2013, Vol. 326, p108-111. 4p.
مصطلحات موضوعية: *MICROSTRUCTURE, *NEODYMIUM compounds, *MAGNETIC properties, *THERMOGRAVIMETRY, *DIFFERENTIAL scanning calorimetry, *CRYSTALLIZATION, *DOPED semiconductors