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61مؤتمر
المؤلفون: Chen, Manlin, Peng, Li, Zhao, Qian, Zou, Xudong, Wang, Xinying, Wei, Xiaoguang
المصدر: 2015 European Conference on Circuit Theory & Design (ECCTD); 2015, p1089-1094, 6p
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62مؤتمر
المؤلفون: Yuan, Guoqing, Luo, Siqin, Zhou, Shiying, Zou, Xudong, Zou, Kaifeng
المصدر: 2015 IEEE Applied Power Electronics Conference & Exposition (APEC); 2015, p2341-2345, 5p
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63مؤتمر
المؤلفون: Chen, Yu, Zhang, Pengcheng, Zou, Xudong, Kang, Yong
المصدر: 2014 IEEE Applied Power Electronics Conference & Exposition - APEC 2014; 2014, p2067-2073, 7p
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64مؤتمر
المؤلفون: Xie, Shaorong, Zhu, Chuan, Peng, Yan, Yao, Jun Feng, Zou, Xudong, Feng, Kai, Luo, Jun, Gu, Jason
المصدر: 2014 IEEE International Conference on Information & Automation (ICIA); 2014, p1306-1311, 6p
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65مؤتمر
المؤلفون: Luo, Jun, Yao, Junfeng, Peng, Yan, Xie, Shaorong, Zou, Xudong, Zhu, Chuan, Feng, Kai, Gu, Jason
المصدر: 2014 IEEE International Conference on Information & Automation (ICIA); 2014, p1300-1305, 6p
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66مؤتمر
المؤلفون: Luo, Jun, Zou, Xudong, Yao, Junfeng, Xie, Shaorong, Pu, Huayan
المصدر: 2014 IEEE International Conference on Information & Automation (ICIA); 2014, p13-18, 6p
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67مؤتمر
المؤلفون: Hu, Sheng, Zou, XuDong, Kang, Yong
المصدر: 2014 International Power Electronics Conference (IPEC-Hiroshima 2014 - ECCE ASIA); 2014, p555-559, 5p
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68مؤتمر
المؤلفون: Hu, Sheng, Zou, Xudong, Kang, Yong
المصدر: 2014 17th International Conference on Electrical Machines & Systems (ICEMS); 2014, p3180-3186, 7p
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69دورية أكاديمية
المؤلفون: Zou, Xudong1, Seshia, Ashwin A.1
المصدر: Journal of Microelectromechanical Systems. Jun2015, Vol. 24 Issue 3, p537-544. 8p.
مصطلحات موضوعية: *MICROELECTROMECHANICAL systems, *FREQUENCY stability, *DAMPING (Mechanics), *NONLINEAR oscillators, *NONLINEAR oscillations
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70دورية أكاديمية
المؤلفون: Zou, Xudong1, Thiruvenkatanathan, Pradyumna1, Seshia, Ashwin A.1 aas41@cam.ac.uk
المصدر: Sensors & Actuators A: Physical. Dec2014, Vol. 220, p168-177. 10p.
مصطلحات موضوعية: *MICROELECTROMECHANICAL system design & construction, *STRAIN gages, *AXIAL loads, *TEMPERATURE measurements, *SILICON-on-insulator technology