المؤلفون: Bhuiyan, Md. Nurul Kabir, Menghini, Mariela, Locquet, Jean-Pierre, Won Seo, Jin, Marchiori, Chiara

المصدر: Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics; Jan2011, Vol. 29 Issue 1, p01A805, 4p

مصطلحات موضوعية: DYSPROSIUM, GERMANIUM, THIN films, MOLECULAR beams, ANNEALING of crystals, X-ray diffraction, SUBSTRATES (Materials science)

المؤلفون: Van Bilzen, Bart¹ Bart.vanbilzen@fys.kuleuven.be, Homm, Pia¹, Dillemans, Leander¹, Su, Chen-Yi¹, Menghini, Mariela¹, Sousa, Marilyne², Marchiori, Chiara², Zhang, Luman³, Seo, Jin Won³, Locquet, Jean-Pierre¹

المصدر: Thin Solid Films. Sep2015 Part A, Vol. 591, p143-148. 6p.

مصطلحات موضوعية: *VANADIUM dioxide, *THIN films, *ANNEALING of crystals, *SAPPHIRES, *HEAT treatment, *MOLECULAR beam epitaxy

المؤلفون: Bhuiyan, Md. Nurul Kabir¹ kabir.bhuiyan@fys.kuleuven.be, Menghini, Mariela¹, Seo, Jin Won², Locquet, Jean-Pierre¹

المصدر: Microelectronic Engineering. Apr2011, Vol. 88 Issue 4, p411-414. 4p.

مصطلحات موضوعية: *MOLECULAR beam epitaxy, *THIN films, *GERMANIDES, *SUBSTRATES (Materials science), *HIGH temperatures, *DYSPROSIUM, *ANNEALING of crystals, *ATOMIC force microscopy