المؤلفون: Yong Chen, Yu Ding, Jung Jin Cho

المصدر: Technometrics. 51:34-46

مصطلحات موضوعية: Statistics and Probability, Mathematical optimization, Applied Mathematics, Linear model, Design matrix, Robust statistics, Estimator, Robust regression, Robustness (computer science), Modeling and Simulation, Linear regression, Algorithm, Mathematics, Sparse matrix

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::8060b950609df679daa28d11fdc79cf1Test
https://doi.org/10.1198/tech.2009.0004Test

المؤلفون: Yu Ding, Pansoo Kim

المصدر: Technometrics. 47:336-348

مصطلحات موضوعية: Statistics and Probability, Iterative design, Computer science, Applied Mathematics, Computer-automated design, computer.software_genre, Design objective, Surrogate model, Modeling and Simulation, Systems design, Probabilistic design, Data mining, Generative Design, Engineering design process, computer

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::b66a2375dfa0b9ac7e51fa328aae9b47Test
https://doi.org/10.1198/004017005000000157Test

المؤلفون: Yu Ding, Jianjun Shi, Yong Chen, Shiyu Zhou

المصدر: Technometrics. 45:312-325

مصطلحات موضوعية: Statistics and Probability, Structure (mathematical logic), Class (computer programming), Data collection, Process (engineering), Computer science, Applied Mathematics, media_common.quotation_subject, Fault (power engineering), Reliability engineering, Modeling and Simulation, Product (mathematics), Quality (business), Aliasing (computing), media_common

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::331a5db491ecca9010fa01abcb68d854Test
https://doi.org/10.1198/004017003000000131Test

المؤلفون: Pansoo Kim¹ pskim@knu.ac.kr, Yu Ding² yuding@iemail.tamu.edu

المصدر: Technometrics. Aug2005, Vol. 47 Issue 3, p336-348. 13p.

مصطلحات موضوعية: *ENGINEERING design, *INDUSTRIAL design, *DATA mining, *DATABASE searching, *DATABASE marketing, COMBINATORIAL optimization

المؤلفون: Shiyu Zhou¹ szhou@engr.wisc.edu, Yu Ding² yuding@iemail.tamu.edu, Yong Chen³ yong-chen@uiowa.edu, Jianjun Shi⁴ shihang@umich.edu

المصدر: Technometrics. Nov2003, Vol. 45 Issue 4, p312-325. 14p.

مصطلحات موضوعية: *QUALITY control, *STANDARDIZATION, *STATISTICAL sampling, *ANALYSIS of variance, *VARIANCES, MULTILEVEL models

المؤلفون: Yu Ding

المصدر: Technometrics. 47:240-240

مصطلحات موضوعية: Statistics and Probability, Computer science, Applied Mathematics, Modeling and Simulation, Mission critical, Reliability (statistics), Reliability engineering

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::016b337edf5de6f94b02878dc2699bc6Test
https://doi.org/10.1198/tech.2005.s268Test

المؤلفون: Jung Jin Cho, Yong Chen, Yu Ding

المصدر: Technometrics; Feb2009, Vol. 51 Issue 1, p34-46, 13p, 7 Diagrams, 2 Charts

مصطلحات موضوعية: SYSTEM failures, BREAKDOWNS (Machinery), SERVICE life, ROBUST control, SPARSE matrices, REGRESSION analysis, ALGORITHMS